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Title: Model Based Statistical Testing of Embedded Systems
Publication type: Conference papers
Authors: Böhr F
Year of publication: 2011
Publisher: IEEE Computer Society
Journal: Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings
Pages: 18 - 25
URL/DOI: http://dx.doi.org/10.1109/ICSTW.2011.11
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